CPO Application

Burn-in & Lifetime Test System

LQ-BI0704
Features
7 independent heating layers with 4 drawers per layer for multi-condition testing
Independent fixture temperature control (40–125°C) with ≤0.5°C stability
Integrated LIV measurement (optical power, voltage, and current curves)
User-editable software with automatic data logging and backup
MES communication and networked system integration
Modular drawer design for easy maintenance and scalability
High-reliability structure for continuous operation

Description

The LQ-BI0704 Burn-in & Lifetime Test System is designed for high-power semiconductor laser aging and reliability testing.
It features seven independent temperature-controlled layers, each with four drawer-type test fixtures, allowing simultaneous multi-condition testing.
Each fixture supports individual temperature control from 40°C to 125°C with ±0.5°C stability and ±1°C accuracy.
The system integrates LIV testing for optical and electrical parameter characterization.
The user-friendly control software enables flexible parameter configuration, automatic data logging, MES communication, and long-term data backup,
making it ideal for laser module aging, optical component reliability, and lifetime testing.
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Specifications
Temperature Control Range 40°C ～ 125°C（每夾具獨立控制）
Resolution ±0.1°C
Uniformity		 ±1°C @ 40–100°C；±1.5°C @ 100–125°C
Stability ≤0.5°C
Accuracy ≤1°C
Test Capacity Channels
32-channel LIV test capability
DUT Type High-power laser diodes (LD / EEL / VCSEL)
Optical Power Range 0–100 mW
Wavelength Range 850–1600 nm
Drive & Control Drive Current Range 0–500 mA (independent per channel)
Current Accuracy ±0.2%
Voltage Range 0–4 V
LIV Module Modes
ACC / LIV (auto sweep supported)
Optical Power Stability ±1% F.S.
Mechanical Design Dimensions / Weight Approx. W1600 × D1200 × H1800 mm; ~2000 kg
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